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date: 19 October 2019

accelerated life test 

A Dictionary of Electronics and Electrical Engineering

Andrew Butterfield,

John Szymanski

A form of *life test of a circuit or device so designed that the duration of the test is appreciably less than the normal expected life of the device. This is achieved by subjecting the item to an excessive applied stress level without altering the basic modes or mechanisms of failure or their relative prevalence. Thermal stress is a commonly applied stress.... ...

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